Soybean crop disease classification using machine learning techniques

Rajashree Krishna; K. V. Prema

doi:10.1109/DISCOVER50404.2020.9278060

Soybean crop disease classification using machine learning techniques

Rajashree Krishna, K. V. Prema

Department of Computer Science and Engineering, Manipal Institute of Technology, Manipal

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution

4 Citations (Scopus)

Abstract

Machine learning is very widely used for many applications like classification and regression. Diseases in the soybean crop are classified using machine learning techniques. Physic crop properties and weather parameters are used as a attributes for classification. K nearest neighbor, naive Bayes, decision tree, neural network algorithms are used for classification. The result is compared with the ensemble classifier called bagging.

Original language	English
Title of host publication	2020 IEEE International Conference on Distributed Computing, VLSI, Electrical Circuits and Robotics, DISCOVER 2020 - Proceedings
Publisher	Institute of Electrical and Electronics Engineers Inc.
Pages	1-5
Number of pages	5
ISBN (Electronic)	9781728198859
DOIs	https://doi.org/10.1109/DISCOVER50404.2020.9278060
Publication status	Published - 30-10-2020
Event	2020 IEEE International Conference on Distributed Computing, VLSI, Electrical Circuits and Robotics, DISCOVER 2020 - Udupi, India Duration: 30-10-2020 → 31-10-2020

Publication series

Name	2020 IEEE International Conference on Distributed Computing, VLSI, Electrical Circuits and Robotics, DISCOVER 2020 - Proceedings

Conference

Conference	2020 IEEE International Conference on Distributed Computing, VLSI, Electrical Circuits and Robotics, DISCOVER 2020
Country/Territory	India
City	Udupi
Period	30-10-20 → 31-10-20

All Science Journal Classification (ASJC) codes

Computer Science Applications
Computer Vision and Pattern Recognition
Hardware and Architecture
Electrical and Electronic Engineering
Control and Optimization
Artificial Intelligence
Computer Networks and Communications

Access to Document

10.1109/DISCOVER50404.2020.9278060

Cite this

Krishna, R., & Prema, K. V. (2020). Soybean crop disease classification using machine learning techniques. In 2020 IEEE International Conference on Distributed Computing, VLSI, Electrical Circuits and Robotics, DISCOVER 2020 - Proceedings (pp. 1-5). [9278060] (2020 IEEE International Conference on Distributed Computing, VLSI, Electrical Circuits and Robotics, DISCOVER 2020 - Proceedings). Institute of Electrical and Electronics Engineers Inc.. https://doi.org/10.1109/DISCOVER50404.2020.9278060

Krishna, Rajashree ; Prema, K. V. / Soybean crop disease classification using machine learning techniques. 2020 IEEE International Conference on Distributed Computing, VLSI, Electrical Circuits and Robotics, DISCOVER 2020 - Proceedings. Institute of Electrical and Electronics Engineers Inc., 2020. pp. 1-5 (2020 IEEE International Conference on Distributed Computing, VLSI, Electrical Circuits and Robotics, DISCOVER 2020 - Proceedings).

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abstract = "Machine learning is very widely used for many applications like classification and regression. Diseases in the soybean crop are classified using machine learning techniques. Physic crop properties and weather parameters are used as a attributes for classification. K nearest neighbor, naive Bayes, decision tree, neural network algorithms are used for classification. The result is compared with the ensemble classifier called bagging.",

author = "Rajashree Krishna and Prema, {K. V.}",

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Krishna, R & Prema, KV 2020, Soybean crop disease classification using machine learning techniques. in 2020 IEEE International Conference on Distributed Computing, VLSI, Electrical Circuits and Robotics, DISCOVER 2020 - Proceedings., 9278060, 2020 IEEE International Conference on Distributed Computing, VLSI, Electrical Circuits and Robotics, DISCOVER 2020 - Proceedings, Institute of Electrical and Electronics Engineers Inc., pp. 1-5, 2020 IEEE International Conference on Distributed Computing, VLSI, Electrical Circuits and Robotics, DISCOVER 2020, Udupi, India, 30-10-20. https://doi.org/10.1109/DISCOVER50404.2020.9278060

Soybean crop disease classification using machine learning techniques. / Krishna, Rajashree ; Prema, K. V.
2020 IEEE International Conference on Distributed Computing, VLSI, Electrical Circuits and Robotics, DISCOVER 2020 - Proceedings. Institute of Electrical and Electronics Engineers Inc., 2020. p. 1-5 9278060 (2020 IEEE International Conference on Distributed Computing, VLSI, Electrical Circuits and Robotics, DISCOVER 2020 - Proceedings).

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution

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PB - Institute of Electrical and Electronics Engineers Inc.

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Y2 - 30 October 2020 through 31 October 2020

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Krishna R , Prema KV. Soybean crop disease classification using machine learning techniques. In 2020 IEEE International Conference on Distributed Computing, VLSI, Electrical Circuits and Robotics, DISCOVER 2020 - Proceedings. Institute of Electrical and Electronics Engineers Inc. 2020. p. 1-5. 9278060. (2020 IEEE International Conference on Distributed Computing, VLSI, Electrical Circuits and Robotics, DISCOVER 2020 - Proceedings). doi: 10.1109/DISCOVER50404.2020.9278060

Soybean crop disease classification using machine learning techniques

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