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Straight imaging and mechanism behind grain boundary electron emission in Pt-doped ultrananocrystalline diamond films
Kalpataru Panda
*
, Eiichi Inami
, Yoshiaki Sugimoto
, K. J. Sankaran
, I. Nan Lin
*
Corresponding author for this work
Department of Physics, Manipal Institute of Technology, Manipal
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peer-review
14
Citations (Scopus)
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INIS
films
100%
electrons
100%
platinum
100%
doped materials
100%
electron emission
100%
diamonds
100%
grain boundaries
100%
tunneling
80%
surfaces
40%
field emission
40%
energy dissipation
40%
investigations
20%
transmission
20%
spectroscopy
20%
transport
20%
chemical properties
20%
dynamics
20%
fabrication
20%
panels
20%
images
20%
annealing
20%
emission
20%
physical properties
20%
mapping
20%
resolution
20%
electrical conductivity
20%
brightness
20%
electron sources
20%
scanning tunneling microscopy
20%
platinum ions
20%
Material Science
Platinum
100%
Diamond Films
100%
Grain Boundaries
100%
Surface (Surface Science)
66%
Chemical Property
33%
Microscopy
33%
Diamond
33%
Electrical Conductivity
33%
Film
33%
Physical Property
33%