Structural, optical and electrical studies of non-toxic oxide- RMnO3 [R=Y, Er, Yb] hexagonal manganite thin-films

D. R. Inchara, S. C. Gurumurthy, M. S. Murari, Mamatha D. Daivajna

Research output: Contribution to journalArticlepeer-review

Abstract

Recently, ferroelectric-photovoltaics have come under the spotlight as a potential class of materials for application in photovoltaic devices. However, the broad bandgap of these ferroelectric-photovoltaic materials causes them to have modest photocurrents[1]. To overcome this challenge hexamanganites can be used to achieve high photovoltaic efficiency as it has a small band gap. Here we present a stable, non-toxic, and cost-efficient hexamanganite RMnO3 [R=Y, Er, Yb] thin films prepared by spray pyrolysis method. The formation of the single phase is confirmed by X-ray diffraction analysis. Morphological studies show grains are uniform and closely packed and the grain size increases with the decrease in ionic radii of rare earth ions. A narrow optical band gap of nearly 1.5 eV is observed for the films. The results of this investigation show that Ultraviolet ray irradiation can be used to tune the bandgap. With a carrier concentration of around 10+14 cm−3, Hall measurements proved that the films are p-type semiconductors. This research illuminates the exploration of stable oxide semiconductors with a small band gap for applications in futuristic solar cells.

Original languageEnglish
Article number140321
JournalThin Solid Films
Volume795
DOIs
Publication statusPublished - 30-04-2024

All Science Journal Classification (ASJC) codes

  • Electronic, Optical and Magnetic Materials
  • Surfaces and Interfaces
  • Surfaces, Coatings and Films
  • Metals and Alloys
  • Materials Chemistry

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