Structure and properties of vacuum deposited cadmium telluride thin films

K. N. Shreekanthan; Kasturi V. Bangera; G. K. Shivakumar; M. G. Mahesha

Structure and properties of vacuum deposited cadmium telluride thin films

K. N. Shreekanthan^*
, Kasturi V. Bangera
, G. K. Shivakumar
, M. G. Mahesha

^*Corresponding author for this work

Research output: Contribution to journal › Article › peer-review

11 Citations (Scopus)

Abstract

Systematic and detailed study of the growth and properties of vacuum deposited cadmium telluride thin films was made. Both p- and n-type films were grown and these films were characterized for their structural, optical, and electrical properties. The crystallographic structure of the deposits was found to be dependent on the rate of deposition. Low deposition rates were observed to result in hexagonal deposits whereas high rates of deposition favoured cubic structure for the film. Electrical and optical properties were also found to be dependent on the deposition parameters.

Original language	English
Pages (from-to)	705-708
Number of pages	4
Journal	Indian Journal of Pure and Applied Physics
Volume	44
Issue number	9
Publication status	Published - 12-12-2006

All Science Journal Classification (ASJC) codes

General Physics and Astronomy

Cite this

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abstract = "Systematic and detailed study of the growth and properties of vacuum deposited cadmium telluride thin films was made. Both p- and n-type films were grown and these films were characterized for their structural, optical, and electrical properties. The crystallographic structure of the deposits was found to be dependent on the rate of deposition. Low deposition rates were observed to result in hexagonal deposits whereas high rates of deposition favoured cubic structure for the film. Electrical and optical properties were also found to be dependent on the deposition parameters.",

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T1 - Structure and properties of vacuum deposited cadmium telluride thin films

AU - Shreekanthan, K. N.

AU - Bangera, Kasturi V.

AU - Shivakumar, G. K.

AU - Mahesha, M. G.

PY - 2006/12/12

Y1 - 2006/12/12

N2 - Systematic and detailed study of the growth and properties of vacuum deposited cadmium telluride thin films was made. Both p- and n-type films were grown and these films were characterized for their structural, optical, and electrical properties. The crystallographic structure of the deposits was found to be dependent on the rate of deposition. Low deposition rates were observed to result in hexagonal deposits whereas high rates of deposition favoured cubic structure for the film. Electrical and optical properties were also found to be dependent on the deposition parameters.

AB - Systematic and detailed study of the growth and properties of vacuum deposited cadmium telluride thin films was made. Both p- and n-type films were grown and these films were characterized for their structural, optical, and electrical properties. The crystallographic structure of the deposits was found to be dependent on the rate of deposition. Low deposition rates were observed to result in hexagonal deposits whereas high rates of deposition favoured cubic structure for the film. Electrical and optical properties were also found to be dependent on the deposition parameters.

UR - https://www.scopus.com/pages/publications/33845328036

UR - https://www.scopus.com/pages/publications/33845328036#tab=citedBy

M3 - Article

AN - SCOPUS:33845328036

SN - 0019-5596

VL - 44

SP - 705

EP - 708

JO - Indian Journal of Pure and Applied Physics

JF - Indian Journal of Pure and Applied Physics

IS - 9

ER -

Structure and properties of vacuum deposited cadmium telluride thin films

Abstract

All Science Journal Classification (ASJC) codes

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