The effect of substrate temperature on the structural, optical and electrical properties of vacuum deposited ZnTe thin films

Gowrish K. Rao; Kasturi V. Bangera; G. K. Shivakumar

doi:10.1016/j.vacuum.2009.06.047

The effect of substrate temperature on the structural, optical and electrical properties of vacuum deposited ZnTe thin films

Gowrish K. Rao
, Kasturi V. Bangera
, G. K. Shivakumar^*

^*Corresponding author for this work

Research output: Contribution to journal › Article › peer-review

47 Citations (Scopus)

Abstract

The present paper reports the effect of substrate temperature on the structural, optical and electrical properties of vacuum deposited zinc telluride (ZnTe) thin films. X-ray diffraction (XRD) analysis of the films, deposited on glass substrates, revealed that they have cubic structure with strong (111) texture. Room temperature deposits are tellurium rich and an increase in the substrate temperature up to 553 °K results in stoichiometric films. Electrical conductivity has been observed to increase with the increase in substrate temperature, accompanied by increase in the carrier concentration and the mobility of the carriers. The optical bandgap energy and the thermal activation energy of the films have also been evaluated.

Original language	English
Pages (from-to)	1485-1488
Number of pages	4
Journal	Vacuum
Volume	83
Issue number	12
DOIs	https://doi.org/10.1016/j.vacuum.2009.06.047
Publication status	Published - 11-08-2009

All Science Journal Classification (ASJC) codes

Surfaces, Coatings and Films
Condensed Matter Physics
Instrumentation

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10.1016/j.vacuum.2009.06.047

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abstract = "The present paper reports the effect of substrate temperature on the structural, optical and electrical properties of vacuum deposited zinc telluride (ZnTe) thin films. X-ray diffraction (XRD) analysis of the films, deposited on glass substrates, revealed that they have cubic structure with strong (111) texture. Room temperature deposits are tellurium rich and an increase in the substrate temperature up to 553 °K results in stoichiometric films. Electrical conductivity has been observed to increase with the increase in substrate temperature, accompanied by increase in the carrier concentration and the mobility of the carriers. The optical bandgap energy and the thermal activation energy of the films have also been evaluated.",

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PY - 2009/8/11

Y1 - 2009/8/11

N2 - The present paper reports the effect of substrate temperature on the structural, optical and electrical properties of vacuum deposited zinc telluride (ZnTe) thin films. X-ray diffraction (XRD) analysis of the films, deposited on glass substrates, revealed that they have cubic structure with strong (111) texture. Room temperature deposits are tellurium rich and an increase in the substrate temperature up to 553 °K results in stoichiometric films. Electrical conductivity has been observed to increase with the increase in substrate temperature, accompanied by increase in the carrier concentration and the mobility of the carriers. The optical bandgap energy and the thermal activation energy of the films have also been evaluated.

AB - The present paper reports the effect of substrate temperature on the structural, optical and electrical properties of vacuum deposited zinc telluride (ZnTe) thin films. X-ray diffraction (XRD) analysis of the films, deposited on glass substrates, revealed that they have cubic structure with strong (111) texture. Room temperature deposits are tellurium rich and an increase in the substrate temperature up to 553 °K results in stoichiometric films. Electrical conductivity has been observed to increase with the increase in substrate temperature, accompanied by increase in the carrier concentration and the mobility of the carriers. The optical bandgap energy and the thermal activation energy of the films have also been evaluated.

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JO - Vacuum

JF - Vacuum

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The effect of substrate temperature on the structural, optical and electrical properties of vacuum deposited ZnTe thin films

Abstract

All Science Journal Classification (ASJC) codes

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