The effects of radiation damage on the spectral resolution of the Chandrayaan-1 x-ray spectrometer

T. E. Walker, D. R. Smith, C. J. Howe, B. J. Kellett, P. Sreekumar, M. Grande

Research output: Chapter in Book/Report/Conference proceedingConference contribution

2 Citations (Scopus)

Abstract

The Chandrayaan-1 X-ray Spectrometer (C1XS) was launched onboard the Indian Space Research Organisation (ISRO) Chandrayaan-1 lunar mission in October 2008. The instrument consisted of 24 swept-charge device silicon X-ray detectors providing a total collecting area of ~24 cm2, corresponding to a 14° field of view (FWHM), with the ability to measure X-rays from 0.8 - 10 keV. During the 10 months the spacecraft was located in orbit around the Moon a number of solar flare X-ray events were detected, along with calibration data from X-ray sources housed inside the movable door of the instrument. This paper presents a study of the degradation in spectral resolution of the measured X-ray calibration lines, comparing those recorded mid way through the mission lifetime with ground based calibration data collected prior to the launch of the instrument. The radiation environment the detectors were subjected to is discussed in light of the actual radiation damage effects on the spectral resolution observed in flight.

Original languageEnglish
Title of host publicationHigh Energy, Optical, and Infrared Detectors for Astronomy IV
DOIs
Publication statusPublished - 2010
EventHigh Energy, Optical, and Infrared Detectors for Astronomy IV - San Diego, CA, United States
Duration: 27-06-201030-06-2010

Publication series

NameProceedings of SPIE - The International Society for Optical Engineering
Volume7742
ISSN (Print)0277-786X

Conference

ConferenceHigh Energy, Optical, and Infrared Detectors for Astronomy IV
Country/TerritoryUnited States
CitySan Diego, CA
Period27-06-1030-06-10

All Science Journal Classification (ASJC) codes

  • Electronic, Optical and Magnetic Materials
  • Condensed Matter Physics
  • Computer Science Applications
  • Applied Mathematics
  • Electrical and Electronic Engineering

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