Theoretical Analysis of Dielectric Assisted Tamm Mode Excitation

Amit Kumar Goyal; K. P. Pradhan; Yehia Massoud

doi:10.1109/NANO54668.2022.9928633

Theoretical Analysis of Dielectric Assisted Tamm Mode Excitation

Amit Kumar Goyal
, K. P. Pradhan
, Yehia Massoud

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution

1 Citation (Scopus)

Abstract

In this paper, a dielectric material assisted excitation mechanism is proposed to confine Tamm Modes at the dielectric-air interface. The performance analysis of proposed structure is performed using transfer matrix method (TMM). The design comprises a bilayer one-dimensional photonic crystal structure having a top defect layer. The defect layer thickness, and incident angles are optimized to confirm the Tamm mode confinement at an operating wavelength of 632.8nm. The proposed structure shows a strong Tamm mode localization for a defect layer thickness of 210nm. Whereas an evanescent Tamm mode is also excited for a lower defect layer thickness of around 170nm.

Original language	English
Title of host publication	2022 IEEE 22nd International Conference on Nanotechnology, NANO 2022
Publisher	IEEE Computer Society
Pages	257-260
Number of pages	4
ISBN (Electronic)	9781665452250
DOIs	https://doi.org/10.1109/NANO54668.2022.9928633
Publication status	Published - 2022
Event	22nd IEEE International Conference on Nanotechnology, NANO 2022 - Palma de Mallorca, Spain Duration: 04-07-2022 → 08-07-2022

Publication series

Name	Proceedings of the IEEE Conference on Nanotechnology
Volume	2022-July
ISSN (Print)	1944-9399
ISSN (Electronic)	1944-9380

Conference

Conference	22nd IEEE International Conference on Nanotechnology, NANO 2022
Country/Territory	Spain
City	Palma de Mallorca
Period	04-07-22 → 08-07-22

All Science Journal Classification (ASJC) codes

Bioengineering
Electrical and Electronic Engineering
Materials Chemistry
Condensed Matter Physics

Access to Document

10.1109/NANO54668.2022.9928633

Cite this

@inproceedings{cb281ed8c9f6478a8b036c8435f5f2b4,

title = "Theoretical Analysis of Dielectric Assisted Tamm Mode Excitation",

abstract = "In this paper, a dielectric material assisted excitation mechanism is proposed to confine Tamm Modes at the dielectric-air interface. The performance analysis of proposed structure is performed using transfer matrix method (TMM). The design comprises a bilayer one-dimensional photonic crystal structure having a top defect layer. The defect layer thickness, and incident angles are optimized to confirm the Tamm mode confinement at an operating wavelength of 632.8nm. The proposed structure shows a strong Tamm mode localization for a defect layer thickness of 210nm. Whereas an evanescent Tamm mode is also excited for a lower defect layer thickness of around 170nm.",

author = "Goyal, \{Amit Kumar\} and Pradhan, \{K. P.\} and Yehia Massoud",

note = "Publisher Copyright: {\textcopyright} 2022 IEEE.; 22nd IEEE International Conference on Nanotechnology, NANO 2022 ; Conference date: 04-07-2022 Through 08-07-2022",

year = "2022",

doi = "10.1109/NANO54668.2022.9928633",

language = "English",

series = "Proceedings of the IEEE Conference on Nanotechnology",

publisher = "IEEE Computer Society",

pages = "257--260",

booktitle = "2022 IEEE 22nd International Conference on Nanotechnology, NANO 2022",

address = "United States",

}

Goyal, AK, Pradhan, KP & Massoud, Y 2022, Theoretical Analysis of Dielectric Assisted Tamm Mode Excitation. in 2022 IEEE 22nd International Conference on Nanotechnology, NANO 2022. Proceedings of the IEEE Conference on Nanotechnology, vol. 2022-July, IEEE Computer Society, pp. 257-260, 22nd IEEE International Conference on Nanotechnology, NANO 2022, Palma de Mallorca, Spain, 04-07-22. https://doi.org/10.1109/NANO54668.2022.9928633

Theoretical Analysis of Dielectric Assisted Tamm Mode Excitation. / Goyal, Amit Kumar; Pradhan, K. P.; Massoud, Yehia.
2022 IEEE 22nd International Conference on Nanotechnology, NANO 2022. IEEE Computer Society, 2022. p. 257-260 (Proceedings of the IEEE Conference on Nanotechnology; Vol. 2022-July).

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution

TY - GEN

T1 - Theoretical Analysis of Dielectric Assisted Tamm Mode Excitation

AU - Goyal, Amit Kumar

AU - Pradhan, K. P.

AU - Massoud, Yehia

PY - 2022

Y1 - 2022

N2 - In this paper, a dielectric material assisted excitation mechanism is proposed to confine Tamm Modes at the dielectric-air interface. The performance analysis of proposed structure is performed using transfer matrix method (TMM). The design comprises a bilayer one-dimensional photonic crystal structure having a top defect layer. The defect layer thickness, and incident angles are optimized to confirm the Tamm mode confinement at an operating wavelength of 632.8nm. The proposed structure shows a strong Tamm mode localization for a defect layer thickness of 210nm. Whereas an evanescent Tamm mode is also excited for a lower defect layer thickness of around 170nm.

AB - In this paper, a dielectric material assisted excitation mechanism is proposed to confine Tamm Modes at the dielectric-air interface. The performance analysis of proposed structure is performed using transfer matrix method (TMM). The design comprises a bilayer one-dimensional photonic crystal structure having a top defect layer. The defect layer thickness, and incident angles are optimized to confirm the Tamm mode confinement at an operating wavelength of 632.8nm. The proposed structure shows a strong Tamm mode localization for a defect layer thickness of 210nm. Whereas an evanescent Tamm mode is also excited for a lower defect layer thickness of around 170nm.

UR - https://www.scopus.com/pages/publications/85142928465

UR - https://www.scopus.com/pages/publications/85142928465#tab=citedBy

U2 - 10.1109/NANO54668.2022.9928633

DO - 10.1109/NANO54668.2022.9928633

M3 - Conference contribution

AN - SCOPUS:85142928465

T3 - Proceedings of the IEEE Conference on Nanotechnology

SP - 257

EP - 260

BT - 2022 IEEE 22nd International Conference on Nanotechnology, NANO 2022

PB - IEEE Computer Society

T2 - 22nd IEEE International Conference on Nanotechnology, NANO 2022

Y2 - 4 July 2022 through 8 July 2022

ER -

Theoretical Analysis of Dielectric Assisted Tamm Mode Excitation

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