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Unveiling the Role of Interface and Dielectric Wall Traps with Self-heating Induced Aging Prediction of Forksheet FET

  • Sunil Rathore*
  • , Sandeep Kumar
  • , Mohd Shakir
  • , Navjeet Bagga*
  • , S. Dasgupta
    • *Corresponding author for this work

    Research output: Chapter in Book/Report/Conference proceeding › Conference contribution

    3   Link opens in a new tab Citations (Scopus)

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