X-ray diffraction studies of CdxZn1-xS thin films prepared by spray pyrolysis technique

Y. Raviprakash; Kasturi V. Bangera; G. K. Shivakumar

doi:10.4028/www.scientific.net/AMR.620.340

X-ray diffraction studies of Cd_xZn_1-xS thin films prepared by spray pyrolysis technique

Y. Raviprakash^*
, Kasturi V. Bangera
, G. K. Shivakumar

^*Corresponding author for this work

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution

Abstract

Thin films of Cd_xZn_(1-x)S (0 ≤ x ≤ 1) were deposited on glass substrates by the chemical spray pyrolysis technique using a less used combination of chemicals. The variation of structural properties of these films in relation with composition was studied in detail. The entire study was made for a wide range of compositions of Cd_xZn _(1-x) S thin films (x=0 to 1 in steps of 0.1). XRD studies reveal that all the films are polycrystalline with hexagonal (wurtzite) structure of which reflection peaks associated with (100), (002) and (110) planes were clearly identified for all the films and inclusion of cadmium into the structure of ZnS improved the crystallinity of the films. The value of lattice constants 'a' and 'c' was found to vary with composition from 0.382 to 0.415 nm and 0.625 to 0.675 nm respectively.

Original language	English
Title of host publication	Advanced X-Ray Characterization Techniques
Pages	340-344
Number of pages	5
DOIs	https://doi.org/10.4028/www.scientific.net/AMR.620.340
Publication status	Published - 08-01-2013
Event	International Conference on X-Ray and related Technique in Research and Industry, ICXRI 2012 - Pulau Pinang, Malaysia Duration: 03-07-2012 → 05-07-2012

Publication series

Name	Advanced Materials Research
Volume	620
ISSN (Print)	1022-6680

Conference

Conference	International Conference on X-Ray and related Technique in Research and Industry, ICXRI 2012
Country/Territory	Malaysia
City	Pulau Pinang
Period	03-07-12 → 05-07-12

All Science Journal Classification (ASJC) codes

General Engineering

Access to Document

10.4028/www.scientific.net/AMR.620.340

Cite this

@inproceedings{706f1787bc8942b5901867018328a4f7,

title = "X-ray diffraction studies of CdxZn1-xS thin films prepared by spray pyrolysis technique",

abstract = "Thin films of CdxZn(1-x)S (0 ≤ x ≤ 1) were deposited on glass substrates by the chemical spray pyrolysis technique using a less used combination of chemicals. The variation of structural properties of these films in relation with composition was studied in detail. The entire study was made for a wide range of compositions of CdxZn (1-x) S thin films (x=0 to 1 in steps of 0.1). XRD studies reveal that all the films are polycrystalline with hexagonal (wurtzite) structure of which reflection peaks associated with (100), (002) and (110) planes were clearly identified for all the films and inclusion of cadmium into the structure of ZnS improved the crystallinity of the films. The value of lattice constants 'a' and 'c' was found to vary with composition from 0.382 to 0.415 nm and 0.625 to 0.675 nm respectively.",

author = "Y. Raviprakash and Bangera, \{Kasturi V.\} and Shivakumar, \{G. K.\}",

year = "2013",

month = jan,

day = "8",

doi = "10.4028/www.scientific.net/AMR.620.340",

language = "English",

isbn = "9783037855607",

series = "Advanced Materials Research",

pages = "340--344",

booktitle = "Advanced X-Ray Characterization Techniques",

note = "International Conference on X-Ray and related Technique in Research and Industry, ICXRI 2012 ; Conference date: 03-07-2012 Through 05-07-2012",

}

Raviprakash, Y, Bangera, KV & Shivakumar, GK 2013, X-ray diffraction studies of Cd_xZn_1-xS thin films prepared by spray pyrolysis technique. in Advanced X-Ray Characterization Techniques. Advanced Materials Research, vol. 620, pp. 340-344, International Conference on X-Ray and related Technique in Research and Industry, ICXRI 2012, Pulau Pinang, Malaysia, 03-07-12. https://doi.org/10.4028/www.scientific.net/AMR.620.340

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AU - Raviprakash, Y.

AU - Bangera, Kasturi V.

AU - Shivakumar, G. K.

PY - 2013/1/8

Y1 - 2013/1/8

N2 - Thin films of CdxZn(1-x)S (0 ≤ x ≤ 1) were deposited on glass substrates by the chemical spray pyrolysis technique using a less used combination of chemicals. The variation of structural properties of these films in relation with composition was studied in detail. The entire study was made for a wide range of compositions of CdxZn (1-x) S thin films (x=0 to 1 in steps of 0.1). XRD studies reveal that all the films are polycrystalline with hexagonal (wurtzite) structure of which reflection peaks associated with (100), (002) and (110) planes were clearly identified for all the films and inclusion of cadmium into the structure of ZnS improved the crystallinity of the films. The value of lattice constants 'a' and 'c' was found to vary with composition from 0.382 to 0.415 nm and 0.625 to 0.675 nm respectively.

AB - Thin films of CdxZn(1-x)S (0 ≤ x ≤ 1) were deposited on glass substrates by the chemical spray pyrolysis technique using a less used combination of chemicals. The variation of structural properties of these films in relation with composition was studied in detail. The entire study was made for a wide range of compositions of CdxZn (1-x) S thin films (x=0 to 1 in steps of 0.1). XRD studies reveal that all the films are polycrystalline with hexagonal (wurtzite) structure of which reflection peaks associated with (100), (002) and (110) planes were clearly identified for all the films and inclusion of cadmium into the structure of ZnS improved the crystallinity of the films. The value of lattice constants 'a' and 'c' was found to vary with composition from 0.382 to 0.415 nm and 0.625 to 0.675 nm respectively.

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